NFC Plugfest

When:

Jan 21, 2019 - Jan 23, 2019
All Day

Where:

Beijing, China - Hosted by China Telecommunication Technology Lab

What:

Plugfests are multiple-day events designed to create a safe, real-world environment where developers with NFC Forum specified devices can verify device interaction across product implementations. They offer NFC Forum members and non-members device-device interoperability testing, end-to-end data sharing, and access to a library of various NFC Forum tags, smart posters and NFC Forum devices.

Event Url:

:

Description:

IMPORTANT NOTE: This event has been POSTPONED

Please stay tuned for a new date and details. 

Plugfests are one-week events designed to create a safe, real-world environment where developers with NFC Forum specified devices can verify device interaction across product implementations. They offer NFC Forum members and non-members device-device interoperability testing, end-to-end data sharing, and access to a library of various NFC Forum tags, smart posters and NFC Forum devices.

Plugfest Testimonials

“It was a very special honor for CTC advanced to host and NFC Plugfest in 2017 on our premises. We really appreciated the presence of our guests and their interest and openness to the topics of the agenda and the fruitful cooperation. It made us particularly proud that we received so much positive feedback after the event.”

Jens Feldmann
Global Lab Coordinator / CTC advanced GmbH

“Participating at NFC Forum Plugfests significantly helps us to verify compliance to the latest standards, gain an overview about available test benches, check out interoperability and compatibility between tags and readers practically, ascertain smooth interaction, but also to identify deviations, analyze and to fix issues and bugs and develop a common understanding for adopting standards. I strongly believe that all participants (no matter if tag, reader or test bench provider) gain knowledge to improve their own products at these events. Last, but not least, the hosts provided a perfect environment for the Plugfest.”

Joerg Schmidt
Business Development for NFC, Transport, and MNO / Infineon

“During the Plugfest planned at Saarbrucken, KEOLABS had the opportunity to test several devices on the market based on the new CR11 Test Specification. These test sessions have been appreciated by the industrials to analyse the quality of their device and by KEOLABS in order to evaluate the capability of our solution. KEOLABS will participate, for sure, to the new Plugfests organized by the NFC Forum.”

Fabien Pollet
Account Manager Smartcard Solutions / KEOLABS

“Attending last year’s NFC Forum Plugfest was extremely beneficial to me as a test vendor. Not only did it provide me with an opportunity to test and debug Keysight’s latest pre-compliance analog test software on a variety of devices, but it also provided valuable test results on participates’ DUTs to help them fine-tune their designs before proceeding to certification. I will definitely participate again in the next Plugfest.”

Johnnie Hancock
Product Manager / Keysight Technologies

“Everyone in the NFC ecosystem wants to deploy products that work correctly. If only one involved component or implementation is not working as it should, customer experience and acceptance will suffer. That’s why the NFC Forum Plugfest is so important. It offers all involved players the opportunity to bring together their tags, NFC readers, and devices prior to launch. These four days of intense testing sessions with our NFC Forum conformance test solution, plus the discussions afterward have unveiled the last hiccups which can now be resolved. Thus, participating in the NFC Forum Plugfest contributes immensely to global interoperability.”

Dr. Michael Jahnich
Director of Business Unit Contactless Test Solutions / COMPRION

“NXP has participated in numerous Plugfests and has consistently concluded that it is time and money well spent to verify compliance of its products to the latest standards. NFC Forum Plugfests bring together an excellent mixture of well-known companies to start-ups who all learn a lot and benefit from both testing and idea exchanges. NXP encourages manufacturers and developers to take advantage of this opportunity by sending engineers to Plugfests to test and compare their products with others and do any necessary debugging and validation in an interactive debugging and testing setting.”

Henk Dannenberg
RFID Standards Architect / NXP Semiconductors

What’s new?

The NFC Forum Compliance Program is introducing Type 5 Tag and Active Peer-to-Peer communication support for Handsets and Readers in late 2018. This Plugfest is an ideal opportunity to test YOUR devices in anticipation of these new Certification programs.

Why should this matter to you?

The NFC Forum has created updates of its the standards and this Plugfest allows you to test your handsets, readers and tags for compliance to the improved standards (Analog 2.1, Digital 2.1 and Activity 2.0). In addition, the Internet of Things is gaining serious momentum and NFC plays a key role in simplifying the IoT for all. Make sure YOUR IoT products are ready to go to market by testing interoperability with the experts.

Why attend?

  • Participate in device-to-device interoperability testing and data sharing
  • Verify your NFC Forum reader devices against NFC Forum handsets with card emulation
  • Verify you mobile handset towards reader devices.
  • Assess your devices using NFC Forum Validated Test Tools supporting latest Certification Release including Analog 2.1
  • Test your device towards Readers
  • Access the NFC Forum Interoperability Test Library (ITL) containing NFC tags and NFC devices
  • Verify interoperability between implementations developed to Digital Protocol 1.0, 1.1, 2/0 and those supporting Digital Protocol 2.1.
  • Gain hands-on experience with Tag certification tests
  • Network and connect with other NFC companies and NFC experts

Who should attend?

Anyone – whether NFC Forum member or non-member – who has implemented the NFC Forum specifications in a device and has, or will have, working samples by the date of the event.

Who should attend the PFWhy they should attend
Chip vendors (with chips for Universal Devices)
  • To test interoperability with Tags
  • To test interoperability with Readers
  • To test interoperability with Handsets
  • To test interoperability with other chip vendors

Handset manufacturers
  • To verify their implementation towards the latest test tool implementations (Certification 12 implementations)
  • To verify Active Communication Mode with other Handset Manufacturers devices

  • To test interoperability with Reader devices

Reader companies
  • To test interoperability with Tag devices
  • To test interoperability with Handsets
Startups
  • Test your device towards market leaders

Tag manufacturers
  • To test interoperability with Tag devices
  • To test interoperability with Handsets
Tool Manufacturers
  • To test interoperability with Tags
  • To test interoperability with Readers
  • To test interoperability with Handsets
  • To test interoperability with other chip vendors

What is the schedule?

Testing sessions are usually scheduled daily from 8:30 – 18:00, with short coffee breaks at 10:30 and 15:45. Lunch is provided at 12:45, and testing resumes at 13:45. A detailed schedule will be distributed approximately one week prior to the event.On Wednesday evening, participants are invited to join the NFC Forum at a hosted social event for refreshments, fun, and networking outside of the lab! Social event details will be sent after registration. More about the testing.

  • Testing will occur under the confidentiality agreement as defined in Section 12 of the NFC Forum Rules of Procedure, binding all participants. Non-members need to sign the Non-Disclosure Agreement in order to participate.
  • Individual participant test results are not reported and remain confidential between the testing parties.
  • The summary information collected during Plugfest events is fed back into the NFC Forum specifications development team to enable continuous improvements.
  • To improve the clarity and testing quality of the specifications, we ask that you submit specification concerns or issues encountered during the testing to the NFC Forum staff available throughout the event.

Need More Information:

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