There are many resources available to product designers to achieve NFC Forum Certification. NFC Forum provides both list for Authorized Test Labs (ATLs) and Approved Test Tools useful to achieve NFC Forum Certification.
Authorized Test Labs | Approved Test Tools | Lab Approval Process | Auditors
Authorized Test Labs
An ATL is a laboratory that has satisfied and continues to satisfy all requirements defined by the NFC Forum, and is thereby authorized to provide certification testing services to product manufacturers. Device manufacturer interested in applying for certification shall use one of these laboratories for product testing.
China Academy of Information Communications Technology
No. 52, Huayuan North Road,Haidian District, Beijing, China 100191
China
Contact
Liang ZhuPhone: +86 10 62304633
Device Class:
Universal, Reader, Tag and Mobile
DEKRA Testing and Certification, S.A.U.
Parque Tecnologico de AndalucíaC/ Severo Ochoa, 229590 MalagaTel. +34 95 261 91 00 Fax. +34 95 261 91 13
Spain
Contact
Noemi Perez DansPhone: Tel.: +34 952 61 93 15
Device Class:
Universal, Reader, Tag, CCC-R, CCC-CE, and Mobile
FIME Japan
ST Building 6F, 1-2-4ShibaKoen, Minato-ku, Tokyo 105-0011, Japan
Japan
Contact
Takahide KadoyamaPhone: Tel +81 (0) 3 6435 8020, Fax +81 (0) 3 6435 8021
Device Class:
NFC Card Emulation, NFC Mobile, NFC Reader, NFC Tag, NFC Universal, CCC Digital Key CE, CCC Digital Key Reader
Sporton International, Inc.
No. 52, Hwa Ya 1St Rd. Hwa Ya Technology ParkKwei-Shan HsiangTaoyuan Hsien Taiwan
Taiwan
Contact
Hendry YangPhone: +886 3327 3456 Ext 558
Device Class:
Universal, Reader, Tag
Telecommunications Technology Association (TTA)
267-2 Seohyeon-dong Bundang-guSeongnam-City, Gyeonggi-do, 463-824, Korea
Korea
Contact
Sookhyun JeonPhone: +82-31-780-9118 (Phone) ,+82-10-5111-1147 (Mobile)
Device Class:
Universal, Reader
Approved Test Tools
The following tools have been approved for NFC Forum Certification Testing. To perform certification testing, ATLs shall use test tools from the Approved Test Tools listed below.
cilab GmbH
Neuseiersbergerstrasse 115
8055 Graz
Austria
Phone: +43 664 8824 8917
Alfred Binder
Chief Executive Officer
Function
Analog Testing
Certification Release
CR13
NFC Card Emulation, NFC Mobile, NFC Reader, NFC Tag, NFC Universal, NFC WLC Reader, NFC WLC Tag, CCC Digital Key CE, CCC Digital Key Reader, USI WLC Reader
Tool
ci230
Test Suite 1.10.79
Firmware 1.29
Certification Release
CR12
Universal/Mobile/Reader/Tag
Tool
ci230
Test Suite 1.10.75
Firmware 1.29
Function
Wireless Charging Testing
Certification Release
CR13
NFC Card Emulation, NFC Mobile, NFC Reader, NFC Universal, NFC WLC Reader, NFC WLC Tag, USI WLC Reader
Tool
ci230
Test Suite 1.13.84
Firmware 1.32
COMPRION GmbH
Lise-Meitner-Strasse
333104 Paderborn
Germany
Phone: +49 (0) 5251 / 6859 0
Fax: +49 (0) 5251 / 6859 999
Mr. Matthias Donner
Head of Software Development Contactless Test Solutions
Function
Analog Testing
Certification Release
CR13
NFC Card Emulation, NFC Mobile, NFC Reader, NFC Tag, NFC Universal, NFC WLC Reader, NFC WLC Tag, CCC Digital Key CE, CCC Digital Key Reader, USI WLC Reader
Tool
UT³ NFC Forum RF Analog 2.2.00 Test Bench Stage 1, 2 and 3, R5.6 with Device Test Center 8.7
Certification Release
CR12
Universal/Mobile/Reader/Tag
Tool
UT³ NFC Forum RF Analog 2.1.00 Test Bench Stage 1, 2 and 3, R5.5.1 with Device Test Center 8.3.1
Function
Performance Testing
Certification Release
CR13
NFC Tag
CR12
NFC Tag
Tool
UT³ NFC Forum Tag Performance Test Bench Stage 1 R5.4.4 with Device Test Center R7.1.4
Function
Digital Protocol Testing
Certification Release
CR13
NFC Card Emulation, NFC Mobile, NFC Reader, NFC Tag, NFC Universal, NFC WLC Reader, NFC WLC Tag, CCC Digital Key CE, CCC Digital Key Reader, USI WLC Reader
Tool
UT³ NFC Forum Digital Protocol 2.3.00 Test Bench, Stage 1, 2 ,3, 4 and 5, R5.6 with Device Test Center 8.7
Certification Release
CR12
Universal/Mobile/Reader/Tag
Tool
UT³ NFC Forum Digital Protocol 2.2.00 Test Bench, Stage 1, 2 , 3 and 4, R5.5.2 with Device Test Center 8.3.2
Certification Release
CR13
NFC Mobile, NFC Reader, NFC Tag, NFC Universal, CCC Digital Key CE, CCC Digital Key Reader
Tool
UT³ NFC Forum Tag Test Bench 1.1.02, Stage 1, 2 and 3, R5.6, with Device Test Center R8.7
Certification Release
CR12
Universal/Mobile/Reader/Tag
Tool
UT³ NFC Forum Tag Test Bench 1.1.00, Stage 1, 2 and 3, R5.5.2, with Device Test Center R8.3.2
Function
LLCP and SNEP Testing
Certification Release
CR13
NFC Universal
CR12
Universal/Reader
Tool
UT³ NFC Forum LLCP 1.2.03, Test Bench Stage 1, R5.5.1, with Device Test Center R8.3.1
Certification Release
CR13
NFC Universal
CR12
Universal/Reader
Tool
UT³ NFC Forum SNEP Test Bench Stage 1 R5.5.2 with Device Test Center R8.3.2
Fime
Z.I. de la Folie Couvrechef
8, rue Commodore J.H. Hallet
14000 Caen
France
+33 2 31 44 08 07
Louis NOVÉ
Product Manager
Function
Analog Testing
Certification Release
CR13
NFC Card Emulation, NFC Mobile, NFC Reader, NFC Tag, NFC Universal, NFC WLC Reader, NFC WLC Tag, CCC Digital Key CE, CCC Digital Key Reader
Tool
NFC Forum Analog Test Suite v.3.4.1 with MPManager 3.9.1 platform
HW: MP500 TCL3, FPGA 26.0, FW 1.22
Certification Release
CR12
Universal/Mobile/Reader/Tag
Tool
NFC Forum Analogue Test Suite V3.3.0 with MPManager 3.8.2 platform
Hardware: MP500 TCL3, FPGA 24, Firmware 1.20
Function
Performance Testing
Certification Release
CR13
NFC Tag
Tool
NFC Forum Tag Performance Test Suite V1.2.0 with MPManager 3.9.1 platform
Hardware: MP500 TCL3, FPGA 26, Firmware 1.22
Certification Release
CR12
Tag
Tool
NFC Forum Tag Performance Test Suite V1.1.0 with MPManager 3.5 platform
Hardware: MP500 TCL3, FPGA 16, Firmware 1.13
Function
Digital Protocol Testing
Certification Release
CR13
NFC Card Emulation, NFC Mobile, NFC Reader, NFC Tag, NFC Universal, NFC WLC Reader, NFC WLC Tag, CCC Digital Key CE, CCC Digital Key Reader
Tool
NFC Forum Digital Test Suite v3.1.0 with MP Manager 3.9.1
Hardware: MP500 TCL3, FPGA 26.0, Firmware 1.22NFC Forum Applicative Test Suite for Tag Testing v.1.1.0Hardware: MP500 TCL3, FPGA 26.0, Firmware 1.22
Certification Release
CR12
Universal/Mobile/Reader/Tag
Tool
NFC Forum Digital Test Suite v3.0.1 with MPManager 3.8.2
Hardware: MP500 TCL3, FPGA 24, Firmware 1.20NFC Forum Applicative Test Suite for Tag Testing v1.0.0 Hardware: MP500 TCL3, FPGA 15, Firmware 1.12
Function
LLCP and SNEP Testing
Certification Release
CR13
NFC Universal
Tool
NFC Forum LLCP Test Suite v1.6.0 with MP Manager 3.9.1
Hardware: MP500 TCL3, FPGA 26.0, Firmware 1.22
Certification Release
CR12
Universal/Reader/Tag
Tool
NFC Forum LLCP Test Suite V1.5.0 with MPManager 3.8.2 platform
Hardware: MP500 TCL3, FPGA 24, Firmware 1.20
Certification Release
CR12
Universal/Reader
Tool
NFC Forum SNEP Test Suite V1.4.0 with MPManager 3.8.2 platform
Hardware: MP500 TCL3, FPGA 23, Firmware 1.19
Certification Release
CR13
NFC Universal
Tool
NFC Forum SNEP Test Suite v1.5.0 with MP Mananger 3.9.1
Hardware: MP500 TCL3, FPGA 26.0, Firmware 1.22
Test Lab Certification Process
Authorized Test Labs
An NFC Forum Authorized Test Laboratory is a laboratory that has satisfied and continues to satisfy all requirements set forth in the NFC Forum Certification Policy and the Authorized Test Laboratory Requirements, and which is thereby authorized to provide certification testing services to product manufacturers and has signed the Test Lab agreement.
The NFC Forum has two types of certification laboratories:
First (1st) Party Test Laboratories
1st Party Test Laboratories are in-house test facilities, owned and controlled by the manufacturer of the products being tested. A First Party Test Laboratory must be a Sponsor or Principal member of NFC Forum.
Third (3rd) Party Test Laboratories
3rd Party Test Laboratories are independent laboratories that provide testing services to manufacturers for the purpose of verifying that implementations conform to the NFC Forum specifications. A Third Party Test Laboratory must be an NFC Forum member at the Associate level or higher.
Authorized Test Labs Audit
Each NFC Forum Authorized Test Lab shall perform an annual audit. Below are the resources needed to complete that task.
Analog Certification Testing Authorization
To prepare for performing Analog certification testing, labs must successfully complete the InterLab Comparision Test. Review and complete the requirements forms below to be assigned a testing slot.
Qualified NFC Forum Auditors
Prospective test laboratories must pass an on-site audit to be approved as an NFC Forum Authorized Test Lab. Once NFC Forum authorized, test labs must complete an audit every 24 months to maintain their status.
The following auditors have been authorized by the NFC Forum to assess a laboratory’s compliance with the NFC Forum Certification Policy. Labs are responsible to contact one of the Qualified Auditors to request an audit when needed. Please copy certification@nfc-forum.org when you request your audit.
Please copy certification@nfc-forum.org when you request your audit